Our primary instrument operator has over 26 years of experience running multiple surface analysis tools. After 30,000 investigative projects, he can see what others do not. Spectrometers producing semi-quantitative chemical results are calibrated with NIST-traceable reference standards to meet an accuracy of ±5% of the actual alloy composition. Quantitative data producing micro-analytical tools have hundreds of reference standards to chemically bracket your unknown alloy or element concentration to an accuracy of ±1% of the actual value.
The Auger Electron Microprobe can detect the outer atoms (7-12 Å (angstroms)) of a surface to better understand what compound is causing weak bonds, coating losses, or discoloration on a finished part. Determining the thickness of the offending layer will give direction on how to carefully remove contamination without harming a substrate.
JEOL JSM-6490LV and Oxford Instruments EDS with Elemental Mapping
- Fracture modes and mechanisms
- Flaws in films and coatings
- Corrosion product analysis
- Thickness measurements
- Pit characterization on downhole tooling
JEOL JSM-6460LV and Oxford Instruments EDS with Elemental Mapping
- Metal alloy identification
- Particle analysis
- Backscattered electron images
- Secondary electron images
- Defects and discontinuities
JEOL JXA-8900 WDS Microprobe with Quantitative Alloy Analysis
- NIST-traceable reference standards
- Filter-caught metal identification
- Foreign metals embedded in plastics sourced for assembly lines
- Grain facets and boundaries analyzed
JEOL JAMP-10S Auger Electron Microprobe with Element Depth Profiling
- Surface analysis of oxide films
- Bond pad contamination identification and thickness determinations
- Medical implant surface cleanliness
- Deposits on semi-conductor parts identified for appropriate cleaning solution choices